Udemy - VLSI DFT Basics - From Industry Perspective
- CategoryOther
- TypeTutorials
- LanguageEnglish
- Total size1.4 GB
- Uploaded Byfreecoursewb
- Downloads44
- Last checkedSep. 30th '25
- Date uploadedSep. 26th '25
- Seeders 5
- Leechers1
Infohash : 7C5C37C999DEA010505847F0FDCB411B4C5E3F3F
VLSI DFT Basics: From Industry Perspective
https://WebToolTip.com
Published 9/2025
Created by Awais Hussain
MP4 | Video: h264, 1280x720 | Audio: AAC, 44.1 KHz, 2 Ch
Level: Beginner | Genre: eLearning | Language: English | Duration: 25 Lectures ( 3h 5m ) | Size: 1.43 GB
The purpose of DFT testing in VLSI along with industry standard DFT implementation flows
What you'll learn
The purpose of DFT testing in VLSI and its role in reliable chip manufacturing
The chip design flow and how DFT integrates into chip design flow
Common manufacturing defects and fault models (stuck-at, transition, IDDQ, path delay)
Introduction to core DFT techniques including SCAN, MBIST, and Boundary Scan
How analog IPs are tested — a topic rarely covered in other courses
Never taught before industry-standard DFT implementation flow used in real chip projects
Requirements
Basic digital logic design knowledge (logic gates, flip-flops, combinational vs. sequential circuits)
Familiarity with HDL (Verilog or VHDL) at an introductory level
Basic awareness of the VLSI design flow (RTL to GDSII)
General understanding of semiconductor basics (what is a chip, role of transistors, CMOS)
Comfortable with timing concepts such as setup/hold, clock, and reset
Files:
[ WebToolTip.com ] Udemy - VLSI DFT Basics - From Industry Perspective- Get Bonus Downloads Here.url (0.2 KB) ~Get Your Files Here ! 1 - Introduction
- 1 - Introduction.mp4 (123.7 MB)
- 1 - Chip Design Flow-RTL to GDSII.mp4 (120.6 MB)
- 2 - Purpose of Testing.mp4 (71.6 MB)
- 3 - Types of Testing.mp4 (149.0 MB)
- 1 - Manufacturing Defects.mp4 (44.4 MB)
- 2 - Fault Modeling and Types.mp4 (33.5 MB)
- 3 - Stuck-at Fault Model.mp4 (26.0 MB)
- 4 - Transition Fault Model.mp4 (22.0 MB)
- 5 - IDDQ Fault Model.mp4 (17.6 MB)
- 6 - Path Delay Fault Model.mp4 (21.9 MB)
- 7 - Cell-Aware Fault Model.mp4 (7.3 MB)
- 1 - Introduction to Basics of Testing Methods Section.mp4 (4.3 MB)
- 2 - Introduction of Basics of Testing Methods.mp4 (4.3 MB)
- 3 - Building Blocks of Chip.mp4 (55.0 MB)
- 4 - Memory BIST (MBIST).mp4 (101.1 MB)
- 5 - Boundary Scan Diagnosis (BSD).mp4 (122.8 MB)
- 6 - SCAN.mp4 (257.3 MB)
- 7 - Analog IPs Testing.mp4 (56.6 MB)
- 1 - Basic DFT Implementation Flows used in Industry.mp4 (45.2 MB)
- 2 - Basic SCAN Insertion Flow.mp4 (85.2 MB)
- 3 - MBIST Insertion Flow.mp4 (23.2 MB)
- 4 - BSD Insertion Flow.mp4 (9.9 MB)
- 5 - Analog IP Test Mode Insertion Flow.mp4 (42.1 MB)
- 6 - Different Tools Usage in DFT.mp4 (18.5 MB)
- 1 - Conclusion.mp4 (6.0 MB)
- Bonus Resources.txt (0.1 KB)
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